Publikationen Halbleiterphysik und Strahlungswandlung

2001 - 2002

BAU - J - KGL02
"Spectral photoresponses and transport properties of polymorphous silicon thin films",
J. P. Kleider, M. Gauthier, C. Longeaud, D. Roy, O. Saadane and R. Brüggemann,
Thin Solid Films, 403, 188-192 (2002).

BAU - J - GKB02
"Properties of polymorphous silicon-germanium alloys deposited under high hydrogen dilution and at high pressure",
M. E. Gueunier, J. P. Kleider, R. Brüggemann, S. Lebib, P. R. I. Cabarrocas, R. Meaudre and B. Canut,
Journal of Applied Physics, 92, 4959-4967 (2002).

BAU - J - GMR02
"Probing localized states distributions in semiconductors by Laplace transform transient photocurrent spectroscopy",
M. J. Gueorguieva, C. Main, S. Reynolds, R. Brüggemann and C. Longeaud,
Journal of Non-Crystalline Solids, 299, 541-545 (2002).


BAU - J
- BMR02a
"Transient photoconductivity for the identification of spatial inhomogeneities in the defect density in amorphous silicon",
R. Brüggemann, C. Main and S. Reynolds,
Physica Status Solidi a-Applied Research, 191, 530-534 (2002).

BAU - J - BMR02
"Depth profiling in amorphous and microcrystalline silicon by transient photoconductivity techniques",
R. Brüggemann, C. Main and S. Reynolds,
Journal of Physics-Condensed Matter, 14, 6909-6915 (2002).

BAU - J - BKu02
"Temperature dependence of the minority-carrier mobility-lifetime product for probing band-tail states in microcrystalline silicon",
R. Brüggemann and O. Kunz,
Physica Status Solidi B-Basic Solid State Physics, 234, R16-R18 (2002).

BAU - J - BKB02a
"Influence of electron and proton irradiation on the electronic properties of microcrystalline silicon",
R. Brüggemann, J. P. Kleider, W. Bronner and I. Zrinscak,
Journal of Non-Crystalline Solids, 299, 632-636 (2002).

BAU - J - BKL02
"Photoconductivity techniques for defect spectroscopy of photovoltaic materials",
R. Brüggemann and J. P. Kleider,
Thin Solid Films, 403, 30-33 (2002).

BAU - J - Bru02a
"Comment on "Gap states of hydrogenated amorphous silicon near and above the threshold of microcrystallinity with subtle boron compensation" Appl. Phys. Lett. 78, 2509 (2001)",
R. Brüggemann,
Applied Physics Letters, 81, 781-782 (2002).

BAU - J - Bru02
"Band-tail profiling in microcrystalline silicon by photoconductivity analysis",
R. Brüggemann,
Journal of Applied Physics, 92, 2540-2543 (2002).

BAU - J - BMB02
"Transport and electrically detected electron spin resonance of microcrystalline silicon before and after electron irradiation",
W. Bronner, M. Mehring and R. Brüggemann,
Physical Review B, 65 (2002).

BAU - J - BKB02
"Comparison of transport and defects properties in hydrogenated polymorphous and amorphous silicon",
W. Bronner, J. P. Kleider, R. Brüggemann, P. R. Cabarrocas, D. Mencaraglia and M. Mehring,
Journal of Non-Crystalline Solids, 299, 551-555 (2002).

BAU - J - BBU02a
"Spatially resolved photoluminescence measurements on Cu(In,Ga)Se-2 thin films",
K. Bothe, G. H. Bauer and T. Unold,
Thin Solid Films, 403, 453-456 (2002).

BAU - J - BVC02
"Electronic properties of microcrystalline SiGe-thin films by Hall-experiments and photo- and dark-transport",
G. H. Bauer, F. Voigt, R. Carius, M. Krause, R. Brüggemann and T. Unold,
Journal of Non-Crystalline Solids, 299, 153-157 (2002).

BAU - J - UMB01
"Conductivity transients in C-60 fullerene thin films",
T. Unold, C. Meyer and G. H. Bauer,
Synthetic Metals, 121, 1179-1180 (2001).

BAU - J - BBM01
"Influence of electron irradiation on the electronic properties of microcrystalline silicon",
R. Brüggemann, W. Bronner and M. Mehring,
Solid State Communications, 119, 23-27 (2001).